Semiconductor device including crystal defect

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure

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Details

257374, 257378, 257389, 257395, 257564, 257586, H01L 27082

Patent

active

061147427

ABSTRACT:
A photoresist pattern is formed on a field oxide film and an element forming region across the field oxide film and the element forming region such that a portion of a surface of the field oxide film and a portion of a surface of a silicon epitaxial layer are continuously exposed. The photoresist pattern is used as a mask to inject boron ions into the silicon epitaxial layer and heat treatment is performed thereon to form an external base containing the relatively significant crystal defect present in the silicon epitaxial layer in the vicinity of the field oxide film. Thus, a semiconductor device can be obtained including a bipolar transistor which provides improved breakdown voltage between the collector and the base and contemplates reduction of current leakage.

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