Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2010-02-24
2011-11-29
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010
Reexamination Certificate
active
08067950
ABSTRACT:
A semiconductor device in which a chip10is mounted on a board, includes: a pad group A provided on the chip10and electrically connected to an internal circuit in the chip10; and a test pad pattern B provided on a region of the chip10except for a region of the chip10where the pad group A is provided. The pad group A includes: pads12aformed on a principal surface of the chip10; bumps16arespectively formed on the pads12awith a barrier metal layer interposed therebetween, and electrically connected to the board. The test pad pattern B includes: test pads12bformed on the principal surface of the chip10; test bumps16brespectively formed on the test pads12bwith a test barrier metal layer interposed therebetween, and interconnects11belectrically connecting adjacent ones of the test pads12b.
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Nagai Noriyuki
Osumi Takatoshi
Hollington Jermele M
McDermott Will & Emery LLP
Panasonic Corporation
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