Measuring and testing – Fluid pressure gauge – Electrical
Reexamination Certificate
2008-09-11
2010-11-16
Allen, Andre J (Department: 2855)
Measuring and testing
Fluid pressure gauge
Electrical
Reexamination Certificate
active
07832279
ABSTRACT:
A semiconductor device includes a first cavity within a semiconductor substrate and a second cavity within the semiconductor substrate. The second cavity is open to an atmosphere and defines a first lamella between the first cavity and the second cavity. The semiconductor device includes a first sense element configured for sensing a pressure on the first lamella.
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Binder Boris
Foeste Bernd
Kautzsch Thoralf
Meinhold Dirk
Rosam Ben
Allen Andre J
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
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