Semiconductor device including a functional element having a...

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – Including additional component in same – non-isolated structure

Reexamination Certificate

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Details

C257S104000, C257S592000

Reexamination Certificate

active

06897546

ABSTRACT:
A semiconductor device which can suppress an electronic breakdown. In the semiconductor device, a base electrode is connected to a base region in a base contact region defined on a surface of the base region. An N-type region having the same conductivity type as an emitter region is provided beneath a boundary portion of the base contact region to surround the base contact region. In other words, a PN-type diode constituted by the P-type base region and the N-type region is provided beneath the boundary portion of the base contact region.

REFERENCES:
patent: 4871686 (1989-10-01), Davies
patent: 4933740 (1990-06-01), Baliga et al.
patent: 47-3015 (1972-02-01), None
patent: UM58-58361 (1983-04-01), None
patent: 58-66356 (1983-04-01), None
patent: 62-58678 (1987-03-01), None
patent: 0532481 (1993-03-01), None
patent: 07-312370 (1995-11-01), None

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