Semiconductor device including a bipolar structure

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor

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257138, 257139, 257341, 257565, 257332, 257334, H01L 2974, H01L 31111, H01L 27082, H01L 27102

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059819812

ABSTRACT:
A high concentration n-type semiconductor region (21) having a width (W) and a distance (D) of constant ranges is selectively formed to be overlapped with or adjacent to a buffer layer (2). When a thickness (L) of an n-type semiconductor layer (3) is 50 .mu.m and the distance (D) is 3 .mu.m, for example, the width (W) is set in the range of 3 .mu.m to 7 .mu.m. In this case, a saturation voltage (V.sub.CE (sat)) and a fall time (t.sub.f) are improved best as compared with a conventional device having no high concentration n-type semiconductor region (21). Thus, the saturation voltage (V.sub.CE (sat)) and the fall time (t.sub.f) are compatibly reduced.

REFERENCES:
patent: 5200638 (1993-04-01), Kida et al.
patent: 5397905 (1995-03-01), Otsuki et al.
patent: 5485022 (1996-01-01), Matsuda
patent: 5569941 (1996-10-01), Takahashi
Patent Abstracts of Japan, vol. 009, No. 089 (E-309), Apr. 18, 1985, JP 59 219963, Dec. 11, 1984.
Patent Abstracts of Japan, vol. 013, No. 564 (E-860), Dec. 14, 1989, JP 01 235272, Sep. 20, 1989.

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