Semiconductor device having thin film wiring layer of aluminum c

Fishing – trapping – and vermin destroying

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357 60, 357 71, 437194, 437197, 437957, H01L 2348

Patent

active

051482592

ABSTRACT:
A semiconductor device comprises one or a plurality of thin film wiring layers made of aluminum containing carbon, so as to obtain hillock-free wiring layers. A method of forming the thin film wiring layer employs a plasma-enhanced chemical vapor deposition or a magnetron-plasma chemical vapor deposition to form the thin film wiring layer.

REFERENCES:
patent: 1718685 (1929-06-01), De Vries et al.
patent: 4673623 (1987-06-01), Gardner et al.
patent: 4720434 (1988-01-01), Kubo et al.
patent: 4899206 (1990-02-01), Sakurai et al.
patent: 4942451 (1990-07-01), Tamaki et al.
patent: 4990997 (1991-02-01), Nishida
patent: 5018001 (1991-05-01), Kondo et al.
patent: 5019891 (1991-05-01), Onuki et al.
patent: 5040048 (1991-08-01), Yasue
patent: 5051812 (1991-09-01), Onuki et al.

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