Semiconductor device having source/channel or drain/channel...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...

Reexamination Certificate

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Details

C257S057000, C257S059000, C257S061000, C257S072000, C257S347000

Reexamination Certificate

active

06838698

ABSTRACT:
A semiconductor device and a method for forming the same are disclosed. The semiconductor device comprising an insulated gate field effect transistor provided with a region having added thereto an element at least one selected from the group consisting of carbon, nitrogen, and oxygen, said region having established at either or both of the vicinity of the boundary between the drain and the semiconductor layer under the gate electrode and the vicinity of the boundary between the source and the semiconductor layer under the gate electrode for example by ion implantation using a mask. It is free from the problems of reverse leakage between the source and the drain, and of throw leakage which occurs even at a voltage below the threshold ascribed to the low voltage resistance between the source and the drain.

REFERENCES:
patent: 4558340 (1985-12-01), Schachter et al.
patent: 4581620 (1986-04-01), Yamazaki et al.
patent: 4642878 (1987-02-01), Maeda
patent: 4646424 (1987-03-01), Parks et al.
patent: 4694317 (1987-09-01), Higashi et al.
patent: 4755865 (1988-07-01), Wilson et al.
patent: 4766471 (1988-08-01), Ovshinsky et al.
patent: 4772927 (1988-09-01), Saito et al.
patent: 4822751 (1989-04-01), Ishizu et al.
patent: 4841348 (1989-06-01), Shizukuishi et al.
patent: 4862240 (1989-08-01), Watanabe et al.
patent: 4899202 (1990-02-01), Blake et al.
patent: 4916508 (1990-04-01), Tsukamoto et al.
patent: 4930874 (1990-06-01), Mitsumune et al.
patent: 4942441 (1990-07-01), Konishi et al.
patent: 4959700 (1990-09-01), Yamazaki
patent: 4971922 (1990-11-01), Watabe et al.
patent: 4994413 (1991-02-01), Eshita
patent: 5060036 (1991-10-01), Choi
patent: 5218214 (1993-06-01), Tyson et al.
patent: 5219784 (1993-06-01), Solheim
patent: 5231297 (1993-07-01), Nakayama et al.
patent: 5235204 (1993-08-01), Tasi
patent: 5313075 (1994-05-01), Zhang et al.
patent: 5315132 (1994-05-01), Yamazaki
patent: 5340999 (1994-08-01), Takeda et al.
patent: 5453858 (1995-09-01), Yamazaki
patent: 5495353 (1996-02-01), Yamazaki et al.
patent: 5591987 (1997-01-01), Yamazaki et al.
patent: 5614732 (1997-03-01), Yamazaki
patent: 5821563 (1998-10-01), Yamazaki et al.
patent: 6011277 (2000-01-01), Yamazaki
patent: 6737676 (2004-05-01), Yamazaki
patent: 0 321 073 (1989-06-01), None
patent: 494694 (1992-01-01), None
patent: 50-120280 (1975-09-01), None
patent: 51-90285 (1976-08-01), None
patent: 51-121272 (1976-10-01), None
patent: 5-214382 (1977-03-01), None
patent: 54-146982 (1979-11-01), None
patent: 5-9103381 (1984-06-01), None
patent: 61-100967 (1986-05-01), None
patent: 6-1100967 (1986-05-01), None
patent: 62-042566 (1987-02-01), None
patent: 62-118576 (1987-05-01), None
patent: 63-066970 (1988-03-01), None
patent: 01-033970 (1989-02-01), None
patent: 64-57755 (1989-03-01), None
patent: 1-161316 (1989-06-01), None
patent: 1289169 (1989-11-01), None
patent: 03-038839 (1991-02-01), None
patent: 03-046238 (1991-02-01), None
patent: 03-062972 (1991-03-01), None
patent: 5-21801 (1993-01-01), None

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