Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate
2005-01-11
2005-01-11
Zarabian, Amir (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
With means to control surface effects
Insulating coating
C257S635000, C257S640000, C257S649000
Reexamination Certificate
active
06841850
ABSTRACT:
A semiconductor device of this invention includes a silicon nitride film formed on a semiconductor substrate and having a density of 2.2 g/cm3or less, and a silicon oxide film formed on the silicon nitride film in an ambient atmosphere containing TEOS and O3.
REFERENCES:
patent: 6037018 (2000-03-01), Jang et al.
patent: 6133160 (2000-10-01), Komiyama et al.
patent: 6277706 (2001-08-01), Ishikawa
patent: 6333547 (2001-12-01), Tanaka et al.
patent: 6579764 (2003-06-01), Kuwazawa
patent: 20020001917 (2002-01-01), Park
patent: 20020076916 (2002-06-01), Yamashita et al.
patent: 20020197823 (2002-12-01), Yoo et al.
patent: 2994616 (1999-10-01), None
patent: 2000-349082 (2000-12-01), None
Akahori Hiroshi
Hiyama Susumu
Saida Shigehiko
Yamamoto Akihito
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Soward Ida M.
Zarabian Amir
LandOfFree
Semiconductor device having silicon nitride film and silicon... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device having silicon nitride film and silicon..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having silicon nitride film and silicon... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3376906