Semiconductor device having silicon nitride film and silicon...

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating

Reexamination Certificate

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C257S635000, C257S640000, C257S649000

Reexamination Certificate

active

06841850

ABSTRACT:
A semiconductor device of this invention includes a silicon nitride film formed on a semiconductor substrate and having a density of 2.2 g/cm3or less, and a silicon oxide film formed on the silicon nitride film in an ambient atmosphere containing TEOS and O3.

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patent: 6133160 (2000-10-01), Komiyama et al.
patent: 6277706 (2001-08-01), Ishikawa
patent: 6333547 (2001-12-01), Tanaka et al.
patent: 6579764 (2003-06-01), Kuwazawa
patent: 20020001917 (2002-01-01), Park
patent: 20020076916 (2002-06-01), Yamashita et al.
patent: 20020197823 (2002-12-01), Yoo et al.
patent: 2994616 (1999-10-01), None
patent: 2000-349082 (2000-12-01), None

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