Semiconductor device having schottky junction and method for...

Semiconductor device manufacturing: process – Forming schottky junction – Compound semiconductor

Reexamination Certificate

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Details

C438S570000, C438S571000, C438S167000, C438S172000, C257S192000, C257S194000

Reexamination Certificate

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07875538

ABSTRACT:
A semiconductor device includes: a nitride semiconductor layer including a channel layer, a Schottky electrode that contacts the nitride semiconductor layer and contains indium, and an ohmic electrode that contacts the channel layer. The nitride semiconductor layer includes a layer that contacts the Schottky electrode and contains AlGaN, InAlGaN or GaN. The Schottky electrode that contains indium includes one of an indium oxide layer and an indium tin oxide layer.

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