Semiconductor device having redistribution layer

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads

Reexamination Certificate

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C257S737000, C257S780000, C257SE23019, C257SE23020, C257SE23021, C257SE23012, C257S678000, C257S690000, C257S700000, C438S108000, C438S612000, C438S613000, C438S614000

Reexamination Certificate

active

08058726

ABSTRACT:
A semiconductor device and method of manufacturing the same are provided. The semiconductor device comprises a semiconductor die including a bond pad, a redistribution layer, and a solder ball. The redistribution layer is formed by sequentially plating copper and nickel, sequentially plating nickel and copper, or sequentially plating copper, nickel, and copper. The redistribution layer includes a nickel layer in order to prevent a crack from occurring in a copper layer. Further, a projection is formed in an area of the redistribution layer or a dielectric layer to which the solder ball is welded and corresponds, so that an area of the redistribution layer to which the solder ball is welded increases, thereby increasing bonding power between the solder ball and the redistribution layer.

REFERENCES:
patent: 6455408 (2002-09-01), Hwang et al.
patent: 7183645 (2007-02-01), Kurosawa et al.
patent: 2003/0214038 (2003-11-01), Nemoto
patent: 2006/0038291 (2006-02-01), Chung et al.
patent: 2007/0252275 (2007-11-01), Huang et al.
patent: 2009/0166859 (2009-07-01), Yuan et al.

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