Semiconductor device having overlapping conductor layers

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

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Details

257280, 257282, 257283, H01L 2980, H01L 31112

Patent

active

052528430

ABSTRACT:
A semiconductor device includes a semiconductor substrate, an active layer formed on the semiconductor substrate, source and drain electrodes respectively formed on the active layer, a gate electrode formed on the active layer between the source and drain electrodes and including a gate contact portion which makes contact with the active layer and has a thickness greater than those of the source and drain electrodes and an overgate portion which is connected to the gate contact portion and extends over at least a portion of one of the source and drain electrodes, a first insulator layer formed on the active layer and covering the source and drain electrodes and the gate contact portion, a first contact hole in the first insulator layer through which the overgate portion connects to the one of the source and drain electrodes, a second insulator layer formed on the first insulator layer and covering the overgate portion, a second contact hole in the second insulator layer at a position above the overgate portion, and an interconnection layer formed on the second insulator layer and connected to the overgate portion via the second contact hole.

REFERENCES:
patent: 4201997 (1980-05-01), Darley et al.
patent: 4202003 (1980-05-01), Darley et al.
patent: 4606113 (1986-08-01), Rode
patent: 4701646 (1987-10-01), Richardson
patent: 4709251 (1987-11-01), Suzuki
patent: 4782032 (1988-11-01), Geissberger et al.
patent: 4814835 (1989-03-01), Tung
patent: 4902635 (1990-08-01), Imamura et al.
patent: 5121174 (1992-06-01), Forgerson, II et al.
IBM Technical Disclosure Bulletin, vol. 22 No. 7, Dec. 1979, "Self-Aligned Silicon MESFET or JFET" by Ning et al, pp. 2918-2921.
"A New Refractory Self-Aligned Gate Technology For GaAs Microwave Power FET's and MMIC's", Geissberger et al, 8093 IEEE Transactions on Electron Devices, vol. 35, No. 5, May 1988, New York, pp. 615-622.

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