Semiconductor device having mutually different two gate threshol

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257194, 257195, 438571, 438572, H01L 31072, H01L 31109, H01L 310328, H01L 310336

Patent

active

060780673

ABSTRACT:
On a semiconductor substrate, a channel layer, an electron supply layer, a third semiconductor layer, a second etching stopper layer, a second semiconductor layer and a first etching stopper layer and a first semiconductor layer are grown in sequential order to form E-type and D-type FETs. The third semiconductor layer and the second semiconductor layer have equal layer thickness, and the second etching stopper layer and the first etching stopper layer have the equal layer thickness. Thus, Vth of the E-type and D-type FETs can be controlled at the predetermined value with high reproduction ability.

REFERENCES:
patent: 4615102 (1986-10-01), Suzuki et al.
patent: 4733283 (1988-03-01), Kuroda
patent: 5021857 (1991-06-01), Suehiro

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having mutually different two gate threshol does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having mutually different two gate threshol, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having mutually different two gate threshol will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1855340

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.