Semiconductor device having multiple element formation...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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C438S454000, C257S409000, C257S488000, C257S659000, C257SE21572

Reexamination Certificate

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07833876

ABSTRACT:
In a manufacturing of a semiconductor device, at least one of elements is formed in each of element formation regions of a substrate having a main side and a rear side, and the substrate is thinned by polished from a rear side of the substrate, and then, multiple trenches are formed on the rear side of the substrate, so that each trench reaches the main side of the substrate. After that, an insulating material is deposited over an inner surface of each trench to form an insulating layer in the trench, so that the element formation regions are isolated. Thereby, generation of cracks and structural steps in the substrate and separation of element formation regions from the substrate can be suppressed.

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Office Action mailed Jan. 6, 2010 from the Japan Patent Office for corresponding patent application No. 2008-106014 (English translation enclosed).
Search Report mailed Sep. 3, 2010 in corresponding European patent application No. 08014382.9 (Engligh translation enclosed).

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