Patent
1976-08-03
1977-11-29
James, Andrew J.
357 65, 357 68, 357 69, 357 72, H01L 2348, H01L 2946, H01L 2954
Patent
active
040608280
ABSTRACT:
A semiconductor device has a through-hole cut in the insulating layer beneath the bonding pad of the wiring layer having a bonding pad onto which a metal wiring is to be connected and this wiring layer is connected through the through-hole with the lower wiring layer so that the connection between the wiring layer having a bonding pad and the lower wiring layer rarely corrodes or becomes disconnected.
REFERENCES:
patent: 3558992 (1971-01-01), Heuner et al.
patent: 3629669 (1971-12-01), Kauppila
patent: 3809625 (1974-05-01), Brown et al.
patent: 3890636 (1975-06-01), Harada et al.
patent: 3942187 (1976-03-01), Gelsing et al.
Hitachi , Ltd.
James Andrew J.
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