Semiconductor device having low dielectric insulating film...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S210000, C257S738000, C257S759000, C257S760000, C257SE23062

Reexamination Certificate

active

07816790

ABSTRACT:
A semiconductor device includes a semiconductor substrate and low dielectric film wiring line laminated structure portions which are provided in regions on the semiconductor substrate except a peripheral portion thereof. Each of the laminated structure portions has a laminated structure of low dielectric films and a plurality of wiring lines. An insulating film is provided on an upper side of the laminated structure portion. Connection pad portions for electrodes are arranged on the insulating film to be electrically connected to the connection pad portions of uppermost wiring lines of the laminated structure portion. Bump electrodes for external connection are provided on the connection pad portions for the electrodes. A sealing film is provided on the insulating film and on the peripheral portion of the semiconductor substrate. Side surfaces of the laminated structure portions are covered with the insulating film or the sealing film.

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Japanese Office Action (and English translation thereof) dated Jun. 17, 2008, issued in a counterpart Japanese Application.
Taiwanese Office Action dated Feb. 26, 2010 and English translation thereof in counterpart Taiwanese Application No. 095146789.

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