Semiconductor device having junction formed from two different h

Radiation imagery chemistry: process – composition – or product th – Post imaging processing – Physical developing

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357 2, 357 61, 357 30, 357 4, 430 84, H01L 2904

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047195010

ABSTRACT:
A semiconductor element is mainly composed of a polycrystalline Si thin film layer containing 0.01-3 atomic %, and further having a maximum surface unevenness of substantially not more than 800 .ANG. and/or a particular range of etching rate when etched with a predetermined etchant.

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Viktrovitch et al., "Diodes Schottky et MIS Tunnelsur Silicium Amorphe Hydrogene de Qualite Photovoltaique Prepare par Pulverisation Cathodique Caracterisation Electrique par Mesures Capacitives," Revue de Physique Appliquee, vol. 14, Jan. 1979, pp. 201-208.
Fan et al., "Proposed Design of a -SiiH Solar Cells Using Ultrathin Active Layer to Increase Conversion Efficiency," Fourteenth IEEE Photovoltaic Specialists Conference, 1980, San Diego, Calif., U.S.A., Jan. 7-10, 1980, pp. 1070-1073.
Campbell, "Enhanced Conductivity in Plasma-Hydrogenated Polysilicon Films," Appl. Phys Lett., 36(7), Apr. 1, 1980, pp. 604-606.
Kamins et al., "Hydrogenation of Transistors Fabricated in Polycrystalline-Silicon Films," IEEE Electron Device Letters, vol. EDL-1, No. 8, Aug. 1980, 159-161.

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