Semiconductor device having identification region for carrying o

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material containing...

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257297, 257289, 257786, 257773, 257 48, H01L 2934

Patent

active

052948129

ABSTRACT:
A semiconductor device capable of performing a failure analysis includes a semiconductor substrate having a plurality of circuit elements, and an identification region provided above the semiconductor substrate so as to record identification information such as position information within wafers, information for wafer numbers, etc. The identification information is given by binary coded patterns, fused patterns of fuse elements, etc.

REFERENCES:
patent: 4896204 (1990-01-01), Hirata et al.
patent: 4908690 (1990-03-01), Hata et al.
patent: 5065222 (1991-11-01), Ishii
patent: 5089866 (1992-02-01), Iwasa
patent: 5105235 (1992-04-01), Tomita
patent: 5177567 (1993-01-01), Klersy

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