Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material containing...
Patent
1993-03-26
1994-03-15
Pascal, Robert J.
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Non-single crystal, or recrystallized, material containing...
257297, 257289, 257786, 257773, 257 48, H01L 2934
Patent
active
052948129
ABSTRACT:
A semiconductor device capable of performing a failure analysis includes a semiconductor substrate having a plurality of circuit elements, and an identification region provided above the semiconductor substrate so as to record identification information such as position information within wafers, information for wafer numbers, etc. The identification information is given by binary coded patterns, fused patterns of fuse elements, etc.
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patent: 5089866 (1992-02-01), Iwasa
patent: 5105235 (1992-04-01), Tomita
patent: 5177567 (1993-01-01), Klersy
Asoh Syoichi
Hashimoto Kazuhiko
Matsui Masataka
Kabushiki Kaisha Toshiba
Pascal Robert J.
Ratliff Reginald A.
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