Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2007-01-03
2008-11-25
Mai, Lam T (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000
Reexamination Certificate
active
07456763
ABSTRACT:
The semiconductor device includes: an A/D conversion circuit; a digital processing circuit for performing processing based on conversion results of the A/D conversion circuit; and an output terminal for testing for outputting the conversion results of the A/D conversion circuit externally. The output of the conversion results from the output terminal for testing is made at timing that is different from timing of other conversion operation of which conversion results are to be outputted later and is longer in cycle than timing of conversion operation.
REFERENCES:
patent: 6331770 (2001-12-01), Sugamori
patent: 7015685 (2006-03-01), Nakayama
patent: 7154427 (2006-12-01), Matsui et al.
patent: 2006/0012498 (2006-01-01), Shim et al.
patent: 63-310058 (1988-12-01), None
patent: 3-75976 (1991-03-01), None
patent: 6-162224 (1994-06-01), None
patent: 9-181604 (1997-07-01), None
patent: 2000-196451 (2000-07-01), None
patent: 2002-181865 (2002-06-01), None
patent: 2002-246909 (2002-08-01), None
Japanese Office Action, with English translation, issued in Japanese Patent Application No. JP 2006-010681, mailed Jun. 3, 2008.
Daio Kinya
Hirose Masaya
Oosaka Tetsuya
Mai Lam T
McDermott Will & Emery LLP
Panasonic Corporation
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