Semiconductor device having aluminum contacts or vias and method

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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Details

257759, 257760, 257761, 257765, 257774, H01L 2348, H01L 2352, H01L 2940

Patent

active

061570826

ABSTRACT:
A semiconductor device and a method of manufacture therefor. The semiconductor device includes: (1) a substrate having a recess therein, (2) an aluminum-alloy layer located over at least a portion of the substrate and filling at least a portion of the recess and (3) a protective metal layer at least partially diffused in the aluminum-alloy layer, the metal protective layer having a high affinity for oxygen and acting as a sacrificial target for oxygen during a reflow of the aluminum-alloy layer.

REFERENCES:
patent: 4275715 (1981-06-01), van de Ven et al.
patent: 4433004 (1984-02-01), Yonezawa et al.
patent: 4870033 (1989-09-01), Hotta, et al.
patent: 4896204 (1990-01-01), Hirata et al.
patent: 4965656 (1990-10-01), Koubuchi et al.
patent: 5108951 (1992-04-01), Chen et al.
patent: 5162262 (1992-11-01), Ajika et al.
patent: 5275715 (1994-01-01), Tuttle
patent: 5332693 (1994-07-01), Kim
patent: 5374592 (1994-12-01), MacNaughton et al.
patent: 5434104 (1995-07-01), Cain et al.
patent: 5489552 (1996-02-01), Merchan et al.
patent: 5534463 (1996-07-01), Lee et al.
patent: 5563099 (1996-10-01), Grass
patent: 5572072 (1996-11-01), Lee
patent: 5635763 (1997-06-01), Inoue et al.
patent: 5668055 (1997-09-01), Xu et al.
Publication dated Jun. 15, 1992 by American Institute of Physics entitled "Roles of Ti-intermetallic compound layers on the electromigration resistance of Al-Cu interconnecting stripes" by C.C. Lee of Motorola, Inc.
F.K. LeGoues, M. Wittmer, T, Kwok, H. -C. W. Huang and P. S. Ho; "THE MICROSTRUCTURE OF TRANSITION METAL/AL(Cu) LAYERS"; Apr. 1987; pp. 940-944.
C. -C. Lee, E. S. Machlin. H. RAthore; "ROLES OF TI-INTERMETALLIC COMPOUND LAYERS ON THE ELECTROMIGRATION RESISTANCE OF AL-CU INTERCONNECTING STRIPES"; J. Appl. Phys. 71 (12), 15 Jun. 1992; pp. 5877-5877.

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