Semiconductor device having a test mode setting circuit

Details Semiconductor device having a test mode setting circuit Semiconductor device having a test mode setting circuit

1996-01-29

1998-05-26

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, 371 221, G01R 3126

Patent

active

057572020

ABSTRACT:
In a semiconductor device having "N" input terminals, a high voltage for a mode switching is applied to a first input terminal, and mode setting information is supplied to the other input terminals. A latch circuit holds the mode setting information supplied during a predetermined period of time starting from application of the high voltage to the first input terminal, during a period of time in which the high voltage continues to be supplied to the first input terminal. Thus, a test is performed on the basis of the mode switching instruction held in the latch circuit and data applied to the other input terminals. On the other hand, if the high voltage is disconnected, the latch circuit is reset.

REFERENCES:
patent: 4837505 (1989-06-01), Mitsunobu
patent: 4841233 (1989-06-01), Yoshida
patent: 4970727 (1990-11-01), Miyawaki
patent: 5023840 (1991-06-01), Tobita
patent: 5036272 (1991-07-01), Cho et al.
patent: 5077738 (1991-12-01), Larsen et al.
patent: 5161159 (1992-11-01), McClure et al.
patent: 5220281 (1993-06-01), Matsuki
patent: 5299203 (1994-03-01), Steele
patent: 5384741 (1995-01-01), Haraguchi et al.
patent: 5523977 (1996-06-01), Tobita et al.
Circuit Diagram of 7475 Chip Rapid Shack Engineer's Notebook P878, 1980 (month unavailable).

Affiliated with

Also associated with

Rating

Semiconductor device having a test mode setting circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having a test mode setting circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having a test mode setting circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1965892