Semiconductor device having a test mode setting circuit

Details Semiconductor device having a test mode setting circuit Semiconductor device having a test mode setting circuit

1994-09-22

1996-06-18

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324763, 371 221, G01R 3126

Patent

active

055281621

ABSTRACT:
In a semiconductor device having "N" input terminals, a high voltage for a mode switching is applied to a first input terminal, and mode setting information is supplied to the other input terminals. A latch circuit holds the mode setting information supplied during a predetermined period of time starting from application of the high voltage to the first input terminal, during a period of time in which the high voltage continues to be supplied to the first input terminal. Thus, a test is performed on the basis of the mode switching instruction held in the latch circuit and data applied to the other input terminals. On the other hand, if the high voltage is disconnected, the latch circuit is reset.

REFERENCES:
patent: 4841233 (1989-06-01), Yoshida
patent: 4970727 (1990-11-01), Miyawaki
patent: 5023840 (1991-06-01), Tobita
patent: 5036272 (1991-07-01), Cho et al.
patent: 5220281 (1993-06-01), Matsoki
Circuit Diagram of 7475 Chip Radio Shack Engineers Notebook p. 78, 1980.

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