Semiconductor device having a test circuit

Details Semiconductor device having a test circuit Semiconductor device having a test circuit

1987-10-23

1989-05-23

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 15, G01R 3128

Patent

active

048333956

ABSTRACT:
A semiconductor device comprises a test signal generating circuit for generating a test signal having an arbitrary frequency, a first buffer for selectively outputting one of the test signal and an external input signal, at least one test circuit supplied with an output signal of the first buffer, an external output terminal, a logic circuit, a second buffer for selectively supplying to the external terminal one of the test signal from the test circuit and an output signal of the logic circuit, and a switching signal generating circuit for generating switching signals for the first and second buffers. The state of the test circuit is checked by use of the test signal to indirectly determine the state of the logic circuit.

REFERENCES:
patent: 4465971 (1984-08-01), Abeyta
patent: 4697140 (1987-09-01), Saito et al.

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