Semiconductor device having a soft-error preventing structure

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357 236, 357 29, 357 74, 357 81, H01L 2314, H01L 2704, G11C 1140

Patent

active

045801576

ABSTRACT:
In a semiconductor device, particularly a memory device, radioactive rays emitted from the ceramic material of the package enclosing the LSI chip of the device detrimentally influence the electrical properties of the device. In the memory device, the information is destroyed by the radioactive ray emission, which is referred to as a soft error. In the present invention, a shield plate having a shielding effect against radioactive rays is arranged in the space defined by a cover and a carrier. Thus, the radioactive rays emitted from the cover and carrier are blocked by the shielding plate, preferably made of high purity silicon, as well as by the silicon substrate of the LSI chip.

REFERENCES:
patent: 3257588 (1966-06-01), Mueller
patent: 3614546 (1971-10-01), Avins
patent: 3710204 (1973-01-01), Batz
patent: 3715638 (1973-02-01), Polye
patent: 3946428 (1976-03-01), Anazawa
patent: 4107555 (1978-08-01), Haas et al.
patent: 4121240 (1978-10-01), Katto
patent: 4177480 (1979-12-01), Hintzmann
patent: 4266239 (1981-05-01), Miyagaki et al.
patent: 4323405 (1982-04-01), Und et al.
Technical Notes; Radiation Shielding of Electronic Components; by Schenk et al, Jun. 11, 1975.
Packaging; MOS/LSI Plastic Package for 20 Cents, Electronics, Dec. 6, 1971, p. 40.

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