Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2011-06-14
2011-06-14
Nguyen, Dao H (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S328000, C257S330000, C257SE21429, C257SE21621, C257SE21628, C257SE29260, C438S209000, C438S259000, C438S268000, C438S270000
Reexamination Certificate
active
07960761
ABSTRACT:
The semiconductor device having a recess channel transistor includes a device isolation structure formed in a semiconductor substrate to define an active region having a recess region at a lower part of sidewalls thereof and a recess channel region formed in the semiconductor substrate under the active region. A method for fabricating the semiconductor device includes forming a device isolation structure in a semiconductor substrate to form an active region having a recess region at a lower part of sidewalls thereof, a gate insulating film formed over the semiconductor substrate including the recess channel region, and a gate electrode formed over the gate insulating film to fill up the recess channel region.
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Korean Notice of Rejection for App. No. 10-2006-0038825, sent Apr. 24, 2007.
Chung Sung Woong
Lee Sang Don
Hynix / Semiconductor Inc.
Kilpatrick Townsend & Stockton LLP
Nguyen Dao H
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