Semiconductor device having a protection circuit with lateral bi

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357 13, 357 35, 357 43, 357 51, 365 56, 365 91, H01L 2978

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047207370

ABSTRACT:
A protection circuit for inner elements such as metal insulator semiconductor (MIS) field effect transistors in a semiconductor device of high packing density has been improved. The protection circuit comprises protective elements of two types. One type has a deep diffusion region providing the element with high surge capacity, that is an ability to withstand the energy of an incoming surge, and the other type has a shallow diffusion region providing a low breakdown voltage. With a combination of these two types of protective element, the protection circuit can withstand high energy of an input surge and, at the same time, provide a low protection voltage suitable to protect the inner elements from breakdown.

REFERENCES:
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patent: 4476476 (1984-10-01), Yu et al.
patent: 4503448 (1985-03-01), Miyasaka
patent: 4509067 (1985-04-01), Minami et al.
M. Battista et al., "Fabrication of a Bilevel Clamp", IBM Tech. Discl. Bull., vol. 19, #6, Nov. 1976, pp. 2086-2087.

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