Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific voltage responsive fault sensor
Reexamination Certificate
2006-01-24
2006-01-24
Jackson, Stephen W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
With specific voltage responsive fault sensor
C361S056000
Reexamination Certificate
active
06989980
ABSTRACT:
A semiconductor device having a protection circuit comprising an NPN type bipolar transistor having a collector and an emitter connected between an external connection terminal of the semiconductor device to be protected and a reference terminal, a PMOS transistor having a drain and source connected between the base and the collector of the NPN type bipolar transistor and configured to supply a base current to the base of the NPN type bipolar transistor, and a control circuit configured to supply the control signal to the gate of the PMOS transistor in response to a voltage emerging on the external connection terminal.
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Steven H. Voldman, et al., “An Automated ESD CAD System for BiCMOS SiGe Technology: A New Millennium for ESD Design”, IBM Micronews, vol. 8, No. 2, Second Quarter 2002, pp. 29-32.
Jackson Stephen W.
Kitov Z
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