Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2011-08-09
2011-08-09
Gebremariam, Samuel A (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S529000, C257S665000, C257S758000, C257SE29319
Reexamination Certificate
active
07994544
ABSTRACT:
A portion-to-be-melted of a fuse is surrounded by plates, so that heat to be generated in a meltdown portion of the fuse under current supply can be confined or accumulated in the vicinity of the meltdown portion of the fuse. This makes it possible to facilitate meltdown of the fuse. The meltdown portion of the fuse in a folded form, rather than in a single here a fuse composed of a straight-line form, is more successful in readily concentrating the heat generated in the fuse under current supply into the meltdown portion, and in further facilitating the meltdown of the fuse.
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Japanese Patent Office issued a Japanese Office Action dated Sep. 1, 2009, Application No. 2003-288829.
Gebremariam Samuel A
Renesas Electronics Corporation
Young & Thompson
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