Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2006-06-20
2006-06-20
Potter, Roy (Department: 2822)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C438S462000
Reexamination Certificate
active
07064047
ABSTRACT:
A semiconductor device has a resin package layer on a principal surface of a semiconductor chip, on which a number of bump electrodes are formed, wherein the semiconductor device has a chamfer surface or a stepped surface on a top edge part such that the external shock or stress applied to such an edge part is dissipated by the chamfer surface of the stepped surface.
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Fukasawa Norio
Hamanaka Yuzo
Matsuki Hirohisa
Morioka Muneharu
Nagashige Kenichi
Fujitsu Limited
Potter Roy
Westerman, Hattori, Daniels & Adrian , L.L.P.
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