Semiconductor device for testing semiconductors

Details Semiconductor device for testing semiconductors Semiconductor device for testing semiconductors

2006-09-19

2006-09-19

Vu, Hung (Department: 2811)

Active solid-state devices (e.g., transistors, solid-state diode

Housing or package

For plural devices

C257S048000

Reexamination Certificate

active

07109582

ABSTRACT:
A semiconductor device that enables a test for individual IC chips mounted on an interposer is provided. In the semiconductor device having the interposer on which a first IC chip and a second IC chip are mounted, the first IC chip and the second IC chip are connected to outside the interposer by input wring and output wiring, respectively, and a transistor element serving as a switch is inserted in series into the wiring connecting between the first IC chip and the second IC chip.

REFERENCES:
patent: 6734549 (2004-05-01), Takeoka et al.

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