Surgery – Diagnostic testing – Measuring or detecting nonradioactive constituent of body...
Reexamination Certificate
2007-03-06
2007-03-06
Winakur, Eric F. (Department: 3735)
Surgery
Diagnostic testing
Measuring or detecting nonradioactive constituent of body...
C600S300000, C600S549000, C600S595000, C128S903000
Reexamination Certificate
active
10457498
ABSTRACT:
A semiconductor device is employable for a compact and light-weight sensor system that is free of the need for battery replacement. The semiconductor device has a sensor chip (SCHIP1) comprising sensors (TD1, AS1, PD1, GS1), an A/D conversion circuit (AD1), a microprocessor (CPU1), a memory (MEM1), a transmission circuit (RF1), and a power generation circuit (CM1). The sensors, the A/D conversion circuit, the microprocessor, the memory, and the transmission circuit are formed on one side (SIDE1) of a substrate, while the power generation unit is formed on the other side (SIDE2) of the substrate.
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Aritsuka Toshiyuki
Miyazaki Masayuki
Nakano Sadaki
Suzuki Kei
Yamashita Shunzo
Antonelli, Terry Stout and Kraus, LLP.
Hitachi , Ltd.
Winakur Eric F.
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