Semiconductor device for preventing malfunction caused by a nois

Details Semiconductor device for preventing malfunction caused by a nois Semiconductor device for preventing malfunction caused by a nois

1991-01-18

1992-09-22

LaRoche, Eugene R.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307263, 307269, 307303, 307491, 307601, 307605, H03K 1716, H03K 19003

Patent

active

051499908

ABSTRACT:
A semiconductor device for absorbing a noise comprises a first and second buffer. The first and second buffers receive an external signal having a rising edge and a falling edge, and performs waveform shaping thereof to produce an output signal. The first buffer, which issues an output signal for controlling the internal circuits of a chip of the semiconductor device so as to make the chip's internal circuits active/stand-by, is not sensitive to the rising edge of the external signal, but is sensitive to the falling edge of the same external signal. The second buffer, which issues an output signal for controlling an output circuit of a chip of the semiconductor device so as to make the output circuit active/stand-by, is sensitive to both the rising and the falling edges of the external signal.

REFERENCES:
patent: 4983861 (1991-01-01), Kikuchi et al.

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