Semiconductor device for low voltage protection with low...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device

Reexamination Certificate

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C257S112000, C257S164000, C257S168000, C257S173000

Reexamination Certificate

active

06956248

ABSTRACT:
A semiconductor thyristor device that incorporates buried region breakdown junctions laterally offset from an emitter region. By spacing the buried regions around the emitter region, current carriers emitted from the buried regions are distributed over a large area of the emitter region, thereby providing a high current capability during initial turn on of the device. In order to achieve low breakover voltage devices, the buried regions are characterized with high impurity concentrations, with the breakdown junctions located near the surface of the chip. The low voltage thyristor device minimizes the area of high dopant concentration junctions, thus minimizing the chip capacitance and permitting high speed, low voltage signal operation.

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U.S. Appl. No. 09/504,224, filed Feb. 15, 2000, entitled, “Very Low Voltage Actuated Thyristor With Centrally-Located Offset Buried Region.”
ST SGS-Thomson Microelectronics, Data Sheet p.p.1/8-8/8, Oct. 1997.
ST SGS-Thomson Microelectronics, Data Sheet SMP Trisil, date unknown.
Handwritten note by Jack L. Turner, Jr., depicting SGS-Thomson Low Voltage (10v) device, Mar. 1997.

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