Semiconductor device for isolating a photodiode to reduce...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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C257S292000

Reexamination Certificate

active

07109535

ABSTRACT:
An improved semiconductor device that reduces reverse bias junction leakage in a photodiode by using a junction isolation region to isolate the photodiode from a trench isolation region. The improved semiconductor device improves image quality for different applications such as stand-alone digital cameras and digital cameras embedded in other imaging devices such as cellular phones and personal digital assistants.

REFERENCES:
patent: 1028470 (2000-08-01), None

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