Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1987-10-01
1989-05-30
James, Andrew J.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
357 30, 357 52, 250270, H01L 2714
Patent
active
048355879
ABSTRACT:
A semiconductor device for detecting gamma radiation displaying superior linearity of response to radiation without showing any energy dependency even if the gamma rays have the high energy is formed using an annular depletion region surrounded by non-depletion regions. The size of the regions is selected so that the distance from the edge of the depletion to the most distant point of the non-depletion region is at least about equal to the mean range of the highest energy gamma ray to be measured.
REFERENCES:
patent: 3472711 (1969-10-01), Chow
patent: 3601668 (1971-08-01), Slaten
patent: 3646527 (1972-02-01), Wada et al.
patent: 3812518 (1974-05-01), Kurz et al.
patent: 4090213 (1978-05-01), Maserijian
patent: 4160985 (1979-07-01), Kamins et al.
patent: 4343962 (1982-08-01), Neugroschel
patent: 4524376 (1982-05-01), Cornick
Sato Noritada
Seki Yasukazu
Fuji Electric & Co., Ltd.
James Andrew J.
Mintel William A.
LandOfFree
Semiconductor device for detecting radiation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device for detecting radiation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device for detecting radiation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2157049