Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1985-02-26
1986-01-28
Myracle, Jerry W.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158R, 324158T, G01R 3126
Patent
active
045674302
ABSTRACT:
A semiconductor device structure is used to determine minority carrier lifetime and photosensitivity for production-processed integrated circuits and devices. The device structure family described herein permits determination of the minority carrier lifetime and photosensitivity at high throughput rates using automated test equipment in a normal test facility environment.
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Baker Stephen M.
Myracle Jerry W.
Recognition Equipment Incorporated
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