Semiconductor device for adjusting threshold value shift due...

Details Semiconductor device for adjusting threshold value shift due... Semiconductor device for adjusting threshold value shift due...

2006-04-18

2006-04-18

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

07030637

ABSTRACT:
A semiconductor device detects and adjusts leakage current dependent on threshold voltage of an integrated semiconductor device. To adjust the threshold voltage variation due to uncertainties in the channel length induced by the fabrication process (short channel effect) in the semiconductor a comparison between small and long channel devices is proposed. According to the comparison result, a bias potential is provided to the semiconductor device to adjust the threshold voltage.

REFERENCES:
patent: 4346344 (1982-08-01), Blauschild
patent: 4789825 (1988-12-01), Carelli et al.
patent: 5565799 (1996-10-01), Houston
patent: 6091283 (2000-07-01), Murgula et al.

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