Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With a step of measuring – testing – or sensing
Patent
1996-07-22
1999-02-02
Breneman, R. Bruce
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With a step of measuring, testing, or sensing
117104, 117913, 117923, 117937, 117940, 117954, 117 92, C30B 100
Patent
active
058658882
ABSTRACT:
A semiconductor device epitaxial layer lateral growth rate control method using CBr.sub.4 gas involves regulating an epitaxial layer lateral growth rate in accordance with the CBr.sub.4 amount doped into the epitaxial layer during the epitaxial layer growth occurring on a patterned GaAs substrate by means of a metalorganic chemical vapor deposition (MOCVD) process. The lateral growth rate may be regulated by varying the growth temperature and the V/III doping ratio.
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"A Study of the Orientation Dependence of Ga(Al)As Growth by MOVPE," by S.D. Hersee et al., Journal of Crystal Growth 77 1986.
"The Fabrication of Quantum Wire Structures Through Application of CCL.sub.4 Towards Lateral Growth Rate Control of GaAs on Patterned GaAs Substrates," by Yong Kim et al., Appl. Phys. Lett. 67 Sep. 25, 1995.
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Kim Moo sung
Kim Seong-Il
Min Suk-ki
Breneman R. Bruce
Korea Institute of Science and Technology
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