Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2006-06-20
2006-06-20
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S723000, C257S777000, C257S784000
Reexamination Certificate
active
07064425
ABSTRACT:
A tip of a first wire is bonded to a first electrode. The first wire is drawn from the first electrode to a bump on a second electrode. A part of the first wire is deformed and bonded to the bump. A tip of a second wire formed in the shape of a ball is bonded to the bump by using a tool in a state in which at least a part of the tip is superposed on the first wire. A part of the first wire which is not deformed by bonding is prevented from being deformed by the tip of the second wire and the tool.
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U.S. Appl. No. 10/347,297 filed Jan. 21, 2003, Takahashi.
Takahashi Takuya
Tomimatsu Hiroyuki
Nguyen DiLinh
Oliff & Berridg,e PLC
Pham Hoai
Seiko Epson Corporation
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