Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-02-14
2006-02-14
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06998869
ABSTRACT:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
REFERENCES:
patent: 4618818 (1986-10-01), Horn
patent: 6069484 (2000-05-01), Sobolewski et al.
patent: 6856158 (2005-02-01), Frame et al.
Agilent Technologies, “Agilent E5250A—Low Leakage Switch Mainframe”, Technical Data, Dec. 1, 2000, 4 pps.
Agilent Technologies, “Agilent 4284A/4285A -Precision LCR Meter Family”, Technical Overview, Jan. 30, 2003, 28 pps.
Hewlett Packard, “HP 4155B—Semiconductor Parameter Analyzer; HP 4156B—Precision Semiconductor Parameter Analyzer”, Technical Data, Jul., 1997, 10 pps.
Shimizu Hiroyuki
Tanida Shinichi
Agilent Technologie,s Inc.
Karlsen Ernest
Nguyen Trung Q
LandOfFree
Semiconductor device characteristics measurement apparatus... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device characteristics measurement apparatus..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device characteristics measurement apparatus... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3653406