Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Smart card package
Reexamination Certificate
2007-10-30
2007-10-30
Ho, Tu-Tu V. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Smart card package
C257S421000, C257S922000, C257SE23064, C257SE23117
Reexamination Certificate
active
11299173
ABSTRACT:
The semiconductor device has a security coating with embedded magnetic particles and magnetoresistive sensors. This renders possible a measurement of the impedance of security elements defined by magnetoresistive sensors and security coating. If initial values of the impedance are stored, actual values can be compared therewith to see if the device has not been electrically probed or modified. Such a comparison can be used to check the authenticity of the device.
REFERENCES:
patent: 2001/0033012 (2001-10-01), Kommerling et al.
patent: 2005/0021993 (2005-01-01), De Jongh et al.
Coehoorn Reinder
De Jongh Petra Elisabeth
Verhaegh Nynke Anne Martine
Ho Tu-Tu V.
NXP B.V.
Zawilski Peter
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