Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-09-15
1996-03-26
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324419, 324537, 437 8, G01R 3102
Patent
active
055023983
ABSTRACT:
In a semiconductor device burn-in apparatus, a film on which a plurality of TAB products, each having a semiconductor device thereon, are arranged in succession and a flexible tape-like wiring board which is situated in the same plane as, and in parallel to, the film and on which electrically conductive wiring patterns are formed are detachably clamped by sockets, in units of one of the TAB products. The film and the wiring board are electrically connected by a wiring board provided on each socket. The film, wiring board and socket are stored in a storage member as a combined structure having an elongated shape, and the combined structure is subjected to a burn-in process.
REFERENCES:
patent: 3560849 (1971-02-01), Ryan et al.
patent: 3761808 (1973-09-01), Ryan
patent: 4716124 (1987-12-01), Yerman et al.
patent: 4745354 (1988-05-01), Fraser
patent: 4779047 (1988-10-01), Selstad et al.
patent: 4956605 (1990-09-01), Biekford et al.
Kabushiki Kaisha Toshiba
Khosravi Kourosh Cyrus
Wieder Kenneth A.
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