Semiconductor device and testing apparatus thereof

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating

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327276, 327290, 331 57, G06F 104

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active

058282580

ABSTRACT:
A tester is connected to a signal output terminal provided in a DRAM chip, and a frequency of a clock signal output from an internal timer is monitored. The frequency of the clock signal is varied by changing the combination of 3 bit signals, so as to obtain signals by which the frequency closest to the set value is obtained. A fuse in the internal timer is disconnected to set the frequency of the clock signal so as to obtain the same state as in the case where that signal is applied.

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"A 4-Mb Psuedo SRAM Operationg at 2.6.+-.1 V with 3-.mu.A Data Retention Current" Katusuki Sato et al. IEEE Journal of Solid-State Circuits, vol. 26, No. 11 Nov. 1991.
Elektronik Sonderheft III, Mikroprozessoren, Franzis-Verlag BmgH, Munchen, 1979, pp. 43-49.
Halbleiterschaltungstechnik von U. Tietze, Ch. Schenk, Springerverlag, Berlin, 10th Ed., 1993, Chapter 15.2.2.

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