Semiconductor device and testing apparatus thereof

Details Semiconductor device and testing apparatus thereof Semiconductor device and testing apparatus thereof

1998-07-28

2000-04-25

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Clock or pulse waveform generating

327144, G06F 104

Patent

active

060548851

ABSTRACT:
A tester is connected to a signal output terminal provided in a DRAM chip, and a frequency of a clock signal output from an internal timer is monitored. The frequency of the clock signal is varied by changing the combination of 3 bit signals, so as to obtain signals by which the frequency closest to the set value is obtained. A fuse in the internal timer is disconnected to set the frequency of the clock signal so as to obtain the same state as in the case where that signal is applied.

REFERENCES:
patent: 5689643 (1997-11-01), O'Hanlan
patent: 5799177 (1998-08-01), McKenzie et al.
patent: 5801561 (1998-09-01), Wong et al.

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