Semiconductor device and test method thereof

Details Semiconductor device and test method thereof Semiconductor device and test method thereof

2011-03-08

2011-03-08

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07902847

ABSTRACT:
A semiconductor device includes: a command control circuit for decoding a command signal to output a test signal and a normal control signal; a normal circuit for performing a predetermined operation in response to the normal control signal; and a test circuit for testing electrical characteristics of unit elements provided in the normal circuit in response to the test signal.

REFERENCES:
patent: 4243937 (1981-01-01), Multani et al.
patent: 4743843 (1988-05-01), Tada
patent: 4778771 (1988-10-01), Hiki
patent: 5243569 (1993-09-01), Atsumi
patent: 6000843 (1999-12-01), Sawada
patent: 6239603 (2001-05-01), Ukei et al.
patent: 6925404 (2005-08-01), Corr
patent: 7005875 (2006-02-01), Natarajan et al.
patent: 7307441 (2007-12-01), Sohn et al.
patent: 7564254 (2009-07-01), Chun
patent: 2008/0088333 (2008-04-01), Chun

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