Semiconductor device and test device for same

Details Semiconductor device and test device for same Semiconductor device and test device for same

2005-04-26

2005-04-26

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06885208

ABSTRACT:
A semiconductor device includes a quadrangular semiconductor substrate and a self test circuit formed on the semiconductor substrate. A plurality of pads are formed on the semiconductor substrate, which pads are coupled at least to the self test circuit. The semiconductor substrate includes four rectangular or square regions which each include a respective corner of the quadrangle, and at least two of the pads are respectively located on diagonally opposite ones of the regions from one another.

REFERENCES:
patent: 3825353 (1974-07-01), Loro
patent: 5929650 (1999-07-01), Pappert et al.
patent: 6061814 (2000-05-01), Sugasawara et al.
patent: 6427222 (2002-07-01), Shau
patent: 6498396 (2002-12-01), Arimoto
patent: 6511857 (2003-01-01), Kono et al.
patent: 6597187 (2003-07-01), Eldridge et al.
patent: 1293824 (2001-05-01), None
patent: 11-274251 (1999-08-01), None
patent: P2000-227459 (2000-08-01), None
patent: 2000-332077 (2000-11-01), None

Affiliated with

Also associated with

Rating

Semiconductor device and test device for same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and test device for same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and test device for same will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3440447