Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Temperature
Reexamination Certificate
2008-03-28
2010-10-05
Tran, Tan N (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Temperature
C257S470000, C257SE21001
Reexamination Certificate
active
07808067
ABSTRACT:
A temperature sensor structure for a semiconductor device. One embodiment provides a semiconductor substrate including the semiconductor device. A dissipation region of the semiconductor device is adjacent to a main surface of the semiconductor substrate. A first layer arrangement is disposed on the main surface of the semiconductor substrate adjacent to the dissipation region of the semiconductor device. A second layer arrangement is disposed on the first layer arrangement with an insulation layer for galvanic separation therebetween. The first and second layer arrangements and the insulation layer form a layer structure on the main surface above the dissipation region. A circuit element is disposed in the second layer arrangement, the circuit element having a temperature-dependent characteristic and being coupled thermally to the dissipation region.
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patent: 2001/0035578 (2001-11-01), Liang et al.
patent: 2002/0072219 (2002-06-01), Avanzino et al.
patent: 19644193 (1998-05-01), None
“Taschenbuch Digitaltechnik”, Christian Siemers, et al., Fachbuchverlag Leipzig.
Stecher Matthias
Weyers Joachim
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Tran Tan N
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