Semiconductor device and semiconductor device module

Details Semiconductor device and semiconductor device module Semiconductor device and semiconductor device module

2008-03-28

2010-12-28

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07859284

ABSTRACT:
To provide a semiconductor module and a semiconductor device enabling more accurate testing of the connection state of the internal wiring between the semiconductor devices. The semiconductor device has switches SW11through SW13that connect a test terminal TT to one end side of wires to be tested, and transistors M21through M23that supply a ground potential VSS to the other end side of the wires to be tested. When a power source potential VDD is supplied to one end of the wires to be tested and a ground potential VSS is supplied to the other end of the wires to be tested, a current path can be formed including the wires to be tested. If a power source potential VDD is supplied to the wires to be tested and a ground potential VSS is supplied to the wires which are not to be tested, a difference in potential can be generated between the wires to be tested and the rest of the wires, which makes it possible to detect a short circuit failure.

REFERENCES:
patent: 6078514 (2000-06-01), Takemae et al.
patent: 2008/0205170 (2008-08-01), Ikeda
patent: 2009/0249110 (2009-10-01), Takakura et al.
patent: 2004-247523 (2004-09-01), None

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