Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2005-04-19
2005-04-19
Quach, T. N. (Department: 2814)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S425000, C438S435000
Reexamination Certificate
active
06881646
ABSTRACT:
A process of producing a semiconductor device having a highly reliable groove isolation structure with a desired radius of curvature formed at the groove upper edge and without formation of any step. The device is produced by reducing the stress generation around the groove upper edge of an element isolation groove on a semiconductor substrate, thereby optimizing the shape of an element isolation groove and making the device finer and improving the device electric characteristics.
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English language translation of the abstract and claims of the document.
Tamaki et al. “Evaluation of Dislocation Generation in U-Groove Isolation” Solid-State Science and Technology, Mar. 1988.
Bryant et al., “Characteristics of CMOS Device Isolation for the ULSI Age” IEEE 1994.
Fukuda Kazushi
Horibe Shinichi
Ikeda Shuji
Ishitsuka Norio
Kobayashi Masamichi
Hitachi ULSI Systems Co. Ltd.
Quach T. N.
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