Semiconductor device and process for manufacturing the same

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29578, 29591, 148 15, 148DIG103, 148DIG105, 357 67, 427 88, 427 43, H01L 2128

Patent

active

045570361

ABSTRACT:
A multilayer structure comprising a Si layer/ a refractory metal oxide layer/ a refractory metal layer/ is subjected to annealing in an atmosphere of hydrogen or an inert gas mixed with hydrogen, thereby converting the multilayer structure into a multilayer structure comprising a Si layer/an inner SiO.sub.2 layer formed by internal oxidation of Si/a refractory metal layer. The inner SiO.sub.2 layer is selectively formed only on the surface of the refractory metal layer, since Si is internally oxidized from the side of the refractory metal layer. In case of gate electrode of a MISFET, the gate electrode and a contact hole for source or drain electrode are positioned in self-alignment with each other via the inner SiO.sub.2 layer. The distance between the gate electrode and the source or drain electrode is determined by the thickness of the inner SiO.sub.2 layer. A semiconductor device with a high density and a high speed is realized.

REFERENCES:
patent: 3566517 (1971-03-01), Brown et al.
patent: 3614829 (1971-10-01), Burgess et al.
patent: 3679492 (1972-07-01), Fang et al.
patent: 3966501 (1976-06-01), Nomura et al.
patent: 3967981 (1976-07-01), Yamazaki
patent: 4149307 (1979-04-01), Henderson
Yanagawa et al., Mo-Gate MOS Metallization System Japanese Journal of Applied Physics, vol. 18 (1979), Supplement 18-1, pp. 237-245.
F. Faggin & T. Klein, Silicon Gate Technology, Solid-State Electronics 1970, vol. 13, pp. 1125-1144.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and process for manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and process for manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and process for manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-51432

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.