Semiconductor device and process for fabrication thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S676000, C257S783000

Reexamination Certificate

active

07012320

ABSTRACT:
A semiconductor chip is attached to a lead frame with a filmy organic die-bonding material having a water absorption of 1.5% by volume or less; having a saturation moisture absorption of 1.0% by volume or less, having a residual volatile component in an amount not more than 3.0% by weight, having a modulus of elasticity of 10 MPa or less at a temperature of 250° C. The semiconductor device thus obtained can be free from occurrence of reflow cracks during reflow soldering for the packaging of semiconductor devices.

REFERENCES:
patent: 3608054 (1971-09-01), Alvino
patent: 4358581 (1982-11-01), Sutton, Jr.
patent: 4460718 (1984-07-01), Tanaka
patent: 4543295 (1985-09-01), St. Clair et al.
patent: 4581096 (1986-04-01), Sato
patent: 4604230 (1986-08-01), Goswami
patent: 4656238 (1987-04-01), Kunimune et al.
patent: 4681928 (1987-07-01), Berger et al.
patent: 4755415 (1988-07-01), Iijima
patent: 4875279 (1989-10-01), Sakiadis
patent: 4933219 (1990-06-01), Sakumoto et al.
patent: 4965331 (1990-10-01), Jackson et al.
patent: 4985105 (1991-01-01), Masuda
patent: 4990292 (1991-02-01), Hattori et al.
patent: 5115089 (1992-05-01), Yoshida et al.
patent: 5118567 (1992-06-01), Komiyama et al.
patent: 5141050 (1992-08-01), Schuft
patent: 5145099 (1992-09-01), Wood et al.
patent: 5177032 (1993-01-01), Fogal et al.
patent: 5204399 (1993-04-01), Edelman
patent: 5234522 (1993-08-01), Suzuki et al.
patent: 5238730 (1993-08-01), Hanawa et al.
patent: 5250637 (1993-10-01), Shiobara et al.
patent: 5277972 (1994-01-01), Sakumoto et al.
patent: 5296074 (1994-03-01), Graham et al.
patent: 5296567 (1994-03-01), Baumann et al.
patent: 5319005 (1994-06-01), Hagiwara et al.
patent: 5360942 (1994-11-01), Hoffman et al.
patent: 5406124 (1995-04-01), Morita et al.
patent: 5432380 (1995-07-01), Jin et al.
patent: 5476908 (1995-12-01), Kishi et al.
patent: 5512628 (1996-04-01), Sakumoto et al.
patent: 5528075 (1996-06-01), Burns
patent: 5605763 (1997-02-01), Yusa et al.
patent: 5635009 (1997-06-01), Kawamura et al.
patent: 5659004 (1997-08-01), Takigawa et al.
patent: 5667899 (1997-09-01), Yusa et al.
patent: 5698891 (1997-12-01), Tomita et al.
patent: 5728473 (1998-03-01), Inoue et al.
patent: 5739099 (1998-04-01), Welch et al.
patent: 5793099 (1998-08-01), Murakami et al.
patent: 5827908 (1998-10-01), Arai et al.
patent: 5837368 (1998-11-01), Hiroe et al.
patent: 5985458 (1999-11-01), Angelopoulos
patent: 5989459 (1999-11-01), Nguyen
patent: 6046072 (2000-04-01), Matsuura et al.
patent: 6097089 (2000-08-01), Gaku et al.
patent: 6099678 (2000-08-01), Kotato et al.
patent: 6201945 (2001-03-01), Schlueter
patent: 6248613 (2001-06-01), Matsuura et al.
patent: 6299513 (2001-10-01), Tsuihiji et al.
patent: 6372080 (2002-04-01), Matsuura et al.
patent: 6717242 (2004-04-01), Takeda et al.
patent: 2001/0015484 (2001-08-01), Matsuura et al.
patent: 0271736 (1988-06-01), None
patent: 285051 (1988-10-01), None
patent: 618614 (1994-10-01), None
patent: 0 618 614 (1994-10-01), None
patent: 775716 (1997-05-01), None
patent: 0 775 716 (1997-05-01), None
patent: 0837498 (1998-04-01), None
patent: 0 285 051 (1998-10-01), None
patent: A-54-12266 (1979-01-01), None
patent: 54-12266 (1979-01-01), None
patent: 54-138371 (1979-10-01), None
patent: A-54-138371 (1979-10-01), None
patent: 58-57730 (1983-04-01), None
patent: 58-222530 (1983-12-01), None
patent: 60-38825 (1985-02-01), None
patent: 60-145630 (1985-08-01), None
patent: 62-141038 (1987-09-01), None
patent: 63-289822 (1988-11-01), None
patent: S64-9226 (1989-01-01), None
patent: 64-22744 (1989-02-01), None
patent: 1-165635 (1989-11-01), None
patent: H2-168636 (1990-06-01), None
patent: 64-19735 (1990-06-01), None
patent: 02-256251 (1990-10-01), None
patent: A-2-256251 (1990-10-01), None
patent: H2-246125 (1990-11-01), None
patent: 3-228 (1991-01-01), None
patent: 3215014 (1991-09-01), None
patent: 4-3438 (1992-01-01), None
patent: 4-3438 (1992-01-01), None
patent: 4-227782 (1992-08-01), None
patent: H5-117596 (1993-05-01), None
patent: 5-125337 (1993-05-01), None
patent: 5-152355 (1993-06-01), None
patent: 5-152355 (1993-06-01), None
patent: 5-152386 (1993-06-01), None
patent: 5-152466 (1993-06-01), None
patent: 5-190022 (1993-07-01), None
patent: 5-190022 (1993-07-01), None
patent: 5-218107 (1993-08-01), None
patent: 5-218107 (1993-08-01), None
patent: H5-331424 (1993-12-01), None
patent: H5-331425 (1993-12-01), None
patent: 5-335379 (1993-12-01), None
patent: 5-105850 (1994-04-01), None
patent: 62-104300 (1994-04-01), None
patent: 06-136300 (1994-05-01), None
patent: 6-145639 (1994-05-01), None
patent: H6-151478 (1994-05-01), None
patent: H6-172714 (1994-06-01), None
patent: 6-204264 (1994-07-01), None
patent: H6-218880 (1994-08-01), None
patent: H6-248241 (1994-09-01), None
patent: H6-256733 (1994-09-01), None
patent: H6-264035 (1994-09-01), None
patent: 6-264035 (1994-09-01), None
patent: 06-326240 (1994-11-01), None
patent: 6326240 (1994-11-01), None
patent: H7-22441 (1995-01-01), None
patent: 7-90239 (1995-04-01), None
patent: H7-90244 (1995-04-01), None
patent: 07090239 (1995-04-01), None
patent: H7-171154 (1995-07-01), None
patent: H7-242820 (1995-09-01), None
patent: 3117966 (2000-10-01), None
patent: 3117971 (2000-10-01), None
patent: 3117972 (2000-10-01), None
patent: WO 94/21744 (1994-09-01), None
“Bynel Adhesive Resin, Series 1100 Including 1123, 1124, and 11E573 Modified Ethylene Vinyl Acetate, Adhesive Evaluation.” 2003: n. pag. Dupont Sep. 27, 2003 <http://www.dupont.com/industrial-polymers/bynel/H-68911/H-68911.html>.
“Standard Test Method for Peel or Stripping Strength of Adhesive Bonds.” in: Annual Book of ASTM Standards. TA 455.A34 S83 1999.
“Standard Test Method for Peel Resistance of Adhesive (T-Peel Test).” in: Annual Book of ASTM Standards. TP 967.A58 2001.
Chemical Abstracts, CAS Registry No. 123046-43-5, 1 page.
Adhesives—Peel test for a flexible-bonded-to-rigid test speciment assembly, Part 1: 90 peel, International Organization for Standardization, ISO 8510-1:1990(E), 8 pages.
Y. Sakamoto et al., “New Type Film-Adhesives for Microelectronics Application,” 92 Proceedings of 42nd Electronic Components & Technology Conference, May 18-20, 1992 (New York: The Institute of Electrical and Electronics Engineers, Inc., 1992): pp. 215-218.
Osaka City Industrial Research Institute et al. ed., Table: List of Properties of Major Thermosetting and Thermoplastic Resins, Plastic Reader 15th Edition (Japan: Plastics Age, Inc., 1987).
Shinji Takeda et al., “Die Bonding Adhesive Film,” Hitachi Chemical Technical Report No. 24 (Jan. 1995) (Tokyo: Hitachi Chemical Co. Ltd.).
Fig. 1 (Water absorption (vol. %), Saturation moisture absorption) (Date Not Available).
Surface Energy, p. 538, Chemical Dictionary 7, Kyoritsu Publishing Co. (Date Not Available).
Thermodynamic equibrium of wetting, p. 1235, Chemical Handbook Applied Chemistry II, Oct. 15, 1986, Maruzen Co.
“Rubber Elastomer Utility Notes”, relates to types of rubber and their chemical structure and properties, Jul. 20, 1991.
Notice of Reason for Refusal for Japanese Appln. No. 2000-346979 mailed on Oct. 22, 2002 (with English Translation).
Opposition against Japanese Patent No. 3187400.
Opposition against Japanese Patent No. 3215014.
European Search Report dated Jul. 15, 2002.
Notice of Reason for Refusal for Japanese Appln. No. 7-173493 mailed on Aug. 29, 2000 (with English Translation).
Notice of Reason for Refusal for Japanese Appln. No. 2000-156125 mailed on Sep. 19, 2000 (with English Translation).
Opposition against Japanese Patent No. 3117966.
Property list, Plastic Reader (1987 15th edition).
International Search Report mailed Apr. 2, 1996 for International Application PCT/JP95/02691.
European Search Report dated Mar. 31, 2003 in European application 03001585.3.
European Search Report dated Dec. 10, 1998.
European Search Report dated Oct. 28, 1998 in European application EP96922225.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and process for fabrication thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and process for fabrication thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and process for fabrication thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3578157

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.